ASSESSMENT OF THE VACUUM LEVEL ON THE QUALITY OF MULTI-LAYERED ANTIREFLECTIVE THIN FILMS USING SiO2/SiO FOR OBJECTIVE OF NIGHT VISION EQUIPMENT

Nguyen Bang Giang; Tran Anh Tuan

Nguyen Bang Giang Institute of Science and Technology, Ministry of Public Security
Tran Anh Tuan Institute of Science and Technology, Ministry of Public Security

Keywords: SiO2 /SiO antireflection films, thin films optical properties, image quality, night vision equipment

Abstract

This paper presents the results of research, calculation, manufacturing of three-layers antireflective film using SiO2/SiO materials pairs. Research method of combining theory and experiment fabricated by electron beam evaporation method. Research results confirm that it is possible to fabricate multi-layer structural antireflective films, and confirm the ability to control fabrication conditions to improve the quality of the multi-layer anti-reflective films of night vision equipment using SiO2/SiO material pairs in the near infrared, short-wave infrared region.

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